12 Oct EMSCAN live webinar! on Wednesday, November 15, 20:30
How to Resolve Desense Problems of Wıreless Devıces Usıng Fast Very-Near-Fıeld Testıng
Join our live webinar to learn how to resolve desense problems of wireless devices using fast very-near-field testing in seconds. Click here to register.
Date: Wednesday, November 15, 2017
Time: 20:30 GMT+3
Overview: Wireless devices often have an extremely sensitive receiver connected to their antennas improve range and reduce power consumption. Even low power noise created by the device in the same band as the receiver it can degrade the overall performance of the device. This effect is called desense and it can occur through direct conducted means or through energy radiated and received through the antenna.
The fundamental source of the noise can be anything in the device including harmonics of clocks, RF signals, power supply, digital lines and because of the extreme sensitivity of the receivers even extremely low level sources of noise can be a problem. The integration of cameras, memory, Ethernet and hard drives into devices creates a large number of potential sources of noise so desense testing and mitigation is a must-do for modern devices.
EMxpert is the tool to help locate the source of interference, understand the mechanism of coupling, plan changes and verify it has been corrected. The EMxpert makes extremely sensitive very-near-field measurements of radiated emissions to get an “emissions map” of a PCB in “real-time”. This map allow designers to locate the source of noise related to desense as well as EMI and EMC problems early in the design cycle thus saving time and cost.
This webinar will discuss very-near-field measurements. Practical tips for measuring wireless devices and a demonstration of an actual “real-time” EMxpert will be shown.
Presenter: Ruska Patton MBA, M.Sc., Director of Product Management, is responsible for the evolution of EMSCAN’s real-time very-near-field measurement solutions. Having started with EMSCAN as Design Engineer and then Manager of the Design Group, Mr. Patton now leads the development of new EMSCAN solutions from concept through to successful products in market. Mr. Patton has authored academic papers, presented seminars and holds several patents related to near-field scanning.
EMSCAN is the world leading developer of real-time test solutions for antenna and PCB designers and verification engineers, without the need for a chamber since 1989, using patented very-near magnetic field measurement technologies and applications.
The EMxpert, a family of compact EMC and EMI diagnostic tools, and the RFxpert, a family of antenna measurement tools, enable engineers to quickly optimize their designs. EMSCAN solutions dramatically increase designer productivity and substantially reduce time-to-market and project development costs. www.emscan.com